University of Arkansas at Pine Bluff - Scanning Electron Microscope with EDS - UAPB A228 (2026)
University Of Arkansas At Pine BluffHigher Ed · Pine Bluff, AR- Due
- Sep 22, 2026
- Deadline passed
- Primary contact
- Lewis Al
- (870) 575-8736
The 30-second brief
The University of Arkansas at Pine Bluff is seeking bids for a Field Emission Scanning Electron Microscope (FE-SEM) with Variable Pressure capability and an integrated EDS detector under solicitation number UAPB A228. The required system includes a Schottky field emission electron source, five-axis motorized stage, secondary and backscattered electron detectors, a chamber navigation camera, and EDS software for elemental identification and mapping. Additional deliverables comprise installation, calibration, testing, commissioning, three days of on-site training, software licenses, manuals, and a minimum one-year parts and labor warranty. Bids are due by Tuesday, September 22, 2026, at 9:00 A.M. at the Purchasing Department, Room 102, 1200 N. University Drive, Pine Bluff, AR 71601.
Field Emission Scanning Electron Microscope (FE-SEM) with Variable Pressure capability, Accelerating voltage range of 0.02 kV to 30 kV minimum, Resolution of 0.9 nm or better at 15 kV and 1.3 nm or better at 1 kV in high-vacuum mode, Variable pressure resolution of 2.0 nm or better at 30 kV, Schottky field emission electron source or equivalent, Five-axis motorized stage with minimum travel, Secondary Electron (SE) detector, Backscattered Electron (BSE) detector, Variable Pressure Secondary Electron Detector (VPSE), Chamber navigation camera, Large specimen chamber with multiple detector ports for EDS and future analytical accessories, Digital image acquisition with resolution up to 32, 768 x 24, 576 pixels minimum, Automated focus, Stigmation, Brightness, And contrast adjustment, Integrated EDS detector with minimum 65 mm² active area, EDS software capable of elemental identification, Quantitative analysis, Elemental mapping, Drift correction, Background removal, And peak overlap correction, Dual-monitor workstation with microscope control software included, Remote monitoring and diagnostic capability, Oil-free vacuum pumping system, Water chiller and air compressor required for system operation, Installation, Calibration, Testing, And commissioning, On Site Training, Software Licenses, Operations Manual and Operator, Warranty- Parts & labor, Shipping
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Summary
The University of Arkansas at Pine Bluff is seeking bids for a Field Emission Scanning Electron Microscope (FE-SEM) with Variable Pressure capability and an integrated EDS detector under solicitation number UAPB A228.
The required system includes a Schottky field emission electron source, five-axis motorized stage, secondary and backscattered electron detectors, a chamber navigation camera, and EDS software for elemental identification and mapping. Additional deliverables comprise installation, calibration, testing, commissioning, three days of on-site training, software licenses, manuals, and a minimum one-year parts and labor warranty. Bids are due by Tuesday, September 22, 2026, at 9:00 A.M. at the Purchasing Department, Room 102, 1200 N. University Drive, Pine Bluff, AR 71601.
REQUIRED DELIVERABLES
Field Emission Scanning Electron Microscope (FE-SEM) with Variable Pressure capability, Accelerating voltage range of 0.02 kV to 30 kV minimum, Resolution of 0.9 nm or better at 15 kV and 1.3 nm or better at 1 kV in high-vacuum mode, Variable pressure resolution of 2.0 nm or better at 30 kV, Schottky field emission electron source or equivalent, Five-axis motorized stage with minimum travel, Secondary Electron (SE) detector, Backscattered Electron (BSE) detector, Variable Pressure Secondary Electron Detector (VPSE), Chamber navigation camera, Large specimen chamber with multiple detector ports for EDS and future analytical accessories, Digital image acquisition with resolution up to 32, 768 x 24, 576 pixels minimum, Automated focus, Stigmation, Brightness, And contrast adjustment, Integrated EDS detector with minimum 65 mm² active area, EDS software capable of elemental identification, Quantitative analysis, Elemental mapping, Drift correction, Background removal, And peak overlap correction, Dual-monitor workstation with microscope control software included, Remote monitoring and diagnostic capability, Oil-free vacuum pumping system, Water chiller and air compressor required for system operation, Installation, Calibration, Testing, And commissioning, On Site Training, Software Licenses, Operations Manual and Operator, Warranty- Parts & labor, Shipping
REQUIRED ATTACHMENTS
7- Bid Signature Page
- Vendor References
- Official Bid Price Sheet
- Specification Sheet
- W-9
- Contract and Grant Disclosure and Certification Form
- Combined Certifications for Contracting with the State of Arkansas
- Submit to
- Purchasing Department Room 102, 1200 N. University Drive, Pine Bluff, AR 71601
- Scope location
- Pine Bluff, AR
- Reported agency
- University of Arkansas at Pine Bluff
Questions about this BID
How do I respond to this Bid from University Of Arkansas At Pine Bluff?
Review the full solicitation document for submission requirements, evaluation criteria, and deadlines. The submission deadline is September 22, 2026. The solicitation specifies required deliverables that must be addressed in your response. Be sure to include all required attachments as outlined in the solicitation. Submissions should be delivered to: Purchasing Department Room 102, 1200 N. University Drive, Pine Bluff, AR 71601. For questions, contact Lewis Al.
Can small businesses or minority-owned firms bid on this Bid?
Most government agencies, including University Of Arkansas At Pine Bluff in AR, encourage participation from small businesses, minority-owned, women-owned, and disadvantaged business enterprises (MBE/WBE/DBE). Check the full solicitation for any small business participation goals.
What happens after the Bid submission deadline?
After the deadline, the issuing agency reviews all submissions against the stated evaluation criteria. This typically includes a compliance check, technical evaluation, cost analysis, and may involve oral presentations with shortlisted vendors.
Can I ask questions about this solicitation before submitting?
Yes, most solicitations allow vendors to submit questions during a designated period. The primary contact is Lewis Al at (870) 575-8736. Questions and answers are typically shared with all prospective bidders.
What are the key deliverables?
The solicitation specifies the following deliverables: Field Emission Scanning Electron Microscope (FE-SEM) with Variable Pressure capability, Accelerating voltage range of 0.02 kV to 30 kV minimum, Resolution of 0.9 nm or better at 15 kV and 1.3 nm or better at 1 kV in high-vacuum mode, Variable pressure resolution of 2.0 nm or better at 30 kV, Schottk. Proposals should clearly address how each deliverable will be met.
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Where can I find more RFPs from University Of Arkansas At Pine Bluff?
All active and historical solicitations from University Of Arkansas At Pine Bluff are tracked and searchable. As a higher ed agency, University Of Arkansas At Pine Bluff regularly publishes solicitations. Visit the agency profile to see current open bids, past contracts, vendor relationships, and decision-maker contacts.
What documents are required to bid on this Bid?
Requirements vary by solicitation, but common documents include a technical proposal, cost/price proposal, proof of insurance, relevant certifications, past performance references, and any forms specified in the solicitation. This solicitation specifically requires the following attachments: Bid Signature Page, Vendor References, Official Bid Price Sheet, Specification Sheet, W-9, Contract and Grant Disclosure and Certification Form, Combined Certifications for Contracting with the State. Review the full document from University Of Arkansas At Pine Bluff for the complete list.
What is the scope of this project?
This solicitation defines a specific project scope. The scope covers the following locations: Pine Bluff, AR. Review the full solicitation for detailed scope requirements.